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Measurement Capabilities
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PTS 1 SR
(175-9203)
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PTS 2 QE/IPCE
(175-9204)
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PTS 2 IQE
(175-9205)
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Current-Voltage (IV) Testing
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Measures VOC , ISC, Rshunt, Pmax, efficiency %, and fill factor
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Included
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Included
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Spectral Response (SR)*
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250 - 2500 nm scanning range
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Included
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Included
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Included
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External Quantum Efficiency (EQE)
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Incident photon to converted electron ratio (IPCE)
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Included
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Included
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Included
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AC and DC measurement mode
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Modulated / Continuous measurement capability
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Included
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Included
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Included
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Internal Quantum Efficiency (IQE)
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The ratio of charge carriers collected by the cell to the number of photons absorbed by the cell
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Included
300 - 1100 nm
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Technical Specifications
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Configuration Description
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PTS 1 SR (175-9203)
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PTS 2 QE/IPCE (175-9204)
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PTS 2 QE+IQE (175-9205)
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Tunable Light Source
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· 150 W Xenon short arc lamp, 1200 hour lifetime
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· 250 - 2500 nm tuning/scanning range (Xenon)
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· 1/4 m Czerny-Turner monochromator with an adjustable bandpass of 0.4 to 48 nm with 600 l/mm grating , 0.2-24 nm with 1200 l/mm grating
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· Motorized triple grating turret system (3 gratings included):
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· 1200 l/mm blazed at 250 nm
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· 1200 l/mm blazed at 500 nm
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· 600 l/mm blazed at 1000 nm
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· Adjustable beam size ( 0.5mm - 19 mm diameter with standard optics)
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· Includes hard coated order sorting filters
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Bias Light Source
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· 150 W Xenon short arc lamp, average lifetime 1200 hours
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· 25x25mm AAA, (ASTM E927-19) Solar Simulator
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· Includes mounted AM1.5G filter + additional filter slot
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Reference Detector
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· Broadband pyroelectric detector with quartz window, Element diameter: 5 mm
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· Calibrated range 250 - 2500 nm
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Measurement System
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· Source meter, maximum 30 W, 30 V, 1 A
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· Voltage accuracy 30 µV and current accuracy 10 pA
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· Measurement time period for 100 IV points is 20s
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· Voltage bias user settable ±10 V capability
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· Lock-in Amplifier
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· Chopper 4 - 200 Hz
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· Standard auto time constant feature
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· Temperature control (10-60 °C) (1)
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Accessory Available
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Accessory Available
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Accessory Available
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· Ac and DC measurement mode
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IQE Measurement System
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· 50 mm integrating sphere
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· Internal quantum efficiency measurement determined from material reflectance measurement (hardware included) 300 - 1100nm range.
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Sample Placement
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· 50 × 50 mm simple sample spacer for proper placement of the sample under the monochromatic and bias light beam. Includes simple electrical connections.
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Software and Interface
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· Modern software written in .NET (Windows 10/11 Operating System)
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· Compatible with Windows 10/11, 32/64bit
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· Data files and automation log exportable as ASCII
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· Pre-configured and tested control computer included
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· Built in microcontroller switches and monitors signals automatically
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· 1 USB port
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· 1 IEC 60320 C14 power entry inlet
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Compliance
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· Intended for use in measurements according to ASTM E 1021-15 , ASTM E948, IEC 60904-8, IEC 60904-1
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Power system
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· Single phase, configurable for 230 VAC, 50 Hz or 110 VAC, 60 Hz
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