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Measurement Capabilities
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PTS –S (175-9201)
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PTS –X (175-9202)
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Current-Voltage (IV) Testing
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Measures VOC , ISC, Jsc, Rshunt, Pmax, efficiency %, and fill factor
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Included
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Spectral Response (SR)*
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Scanning range
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250 - 2500 nm
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300-5000 nm
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External Quantum Efficiency (EQE)
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Incident photon to converted electron ratio (IPCE)
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Included
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AC and DC measurement mode
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Modulated / Continuous measurement capability
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Included
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Internal Quantum Efficiency (IQE)
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The ratio of charge carriers collected by the cell to the number of photons absorbed by the cell
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Available as an add-on
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Technical Specifications
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Configuration Description
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PTS-S
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PTS-X
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(175-9201)
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(175-9202)
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Tunable Light Source
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150 W Xenon short arc lamp (1200 hour lifetime) and /or 250 W QTH lamp (average 50 hour lifetime)
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Xe short arc lamp
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Xe+QTH lamp
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Tuning/scanning range
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250-2500 nm
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300-5000 nm
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1/4 m Czerny-Turner monochromator with an adjustable bandpass and motorized triple grating turret system (3 gratings):
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0.2-24 nm with 1200 l/mm
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0.4-48 nm with 600 l/mm
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blazed @ 250 nm
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blazed @ 500 nm
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0.2-24 nm with 1200 l/mm
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0.8-96 nm with 300 l/mm
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blazed @ 500 nm
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blazed @ 2000 nm
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0.4-48 nm with 600 l/mm
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1.6-192 nm with 150 l/mm blazed @ 5400 nm
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blazed @1000 nm
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Adjustable beam size
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0.5-2.4 mm diameter at focal plane with standard optics
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Hard coated order sorting filters
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Included
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Bias Light Source
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150 W or 300 W Xenon short arc lamp, average lifetime 1200 hours for 150 W, 900 hours for 300 W.
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Optional:
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150 W with Standard Sample Chamber
OR
300 W with Extended Sample Chamber
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25 × 25 or 50 × 50 mm AAA, (ASTM E927-19) Solar Simulator
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Includes mounted AM1.5G filter + additional filter slot
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Reference Detector
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Broadband pyroelectric detector, Element diameter: 5 mm
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Included
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Calibrated range
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250-2500 nm
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300-5000 nm
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IQE Measurement System
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50 mm integrating sphere
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Optional, available as an add-on
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Internal quantum efficiency measurement determined from material reflectance measurement (hardware included) 250-2500 nm range.
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Measurement System
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Source meter
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Optional
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Lock-in Amplifier
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Included
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Chopper 4 - 200 Hz
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Included
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Standard auto time constant feature
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Included
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Temperature control (10-60 °C)
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Accessory Available1
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AC and DC measurement mode
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Included
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Sample Placement
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Sample spacer for proper placement of the sample under the monochromatic and bias light beam
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A simple 50 × 50 mm sample spacer is included, and various cell chucks are available as add-ons. Includes electrical connections
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Software and Interface
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Modern software written in .NET (Windows 11 Operating System)
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SciPV Included
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Data files and automation log exportable as ASCII
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Yes
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Pre-configured and tested control computer included
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Yes
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Built-in microcontroller switches and monitors signals automatically
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Included
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1 USB port
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USB-B Interface
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1 IEC 60320 C14 power entry inlet
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Yes
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Compliance
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Intended for use in measurements according to ASTM E 1021-15 , ASTM E948, IEC 60904-8, IEC 60904-1
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Yes
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Power system
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Single phase, configurable for 240 VAC, 50 Hz or 120 VAC, 60 Hz
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Yes
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