Measurement Capabilities

PTS –S (175-9201)

PTS –X (175-9202)

Current-Voltage (IV) Testing

Measures V_OC , I_SC, R_shunt, P_max, efficiency %, and fill factor

Included

Included

Spectral Response (SR)^*

Scanning range

250 - 2500 nm

300-5000 nm

External Quantum Efficiency (EQE)

Incident photon to converted electron ratio (IPCE)

Included

Included

AC and DC measurement mode

Modulated / Continuous measurement capability

Included

Included

Internal Quantum Efficiency (IQE)

The ratio of charge carriers collected by the cell to the number of photons absorbed by the cell

Available as an add-on

Available as an add-on

Configuration Description

PTS-S                                                                            (175-9201)

PTS-X                        (175-9202)

Tunable

Light Source

150 W  Xenon short arc lamp

(1200 hour lifetime) and /or 250W QTH lamp

Xe short arc lamp

Xe +QTH lamp

· Tuning/scanning range

250 - 2500 nm

300 - 5000 nm

·  1/4 m Czerny-Turner monochromator

with

an adjustable bandpass and motorized

triple grating turret system (3 gratings):

0.2-24 nm with 1200 l/mm  grating  @250 nm

0.2-24 nm with 1200 l/mm  blaze @500 nm

0.4 - 48 nm with 600 l/mm @1000 nm

0.4 to 48 nm with 600 l/mm blaze @ 500 nm

0.8 - 96 nm with  300l/mm blaze @ 2000 nm

1.6 - 192 nm with 150l/mm blazed @ 5400 nm

· Adjustable beam size

0.5mm - 2.4 mm diameter minimum with standard optics

· Hard coated order sorting filters

Included

Included

Bias

Light Source

· 150 W or 300W Xenon short arc lamp

average lifetime 1200 hours

Optional, 150W with Standard Sample Chamber, 300W with Extended Sample Chamber

· 25x25 or 50x50 mm AAA, (ASTM E927-19) Solar Simulator

· Includes mounted AM1.5G

filter + additional filter slot

Reference      Detector

· Broadband pyroelectric detector,

Element diameter: 5 mm

Included

Included

· Calibrated range

250 - 2500 nm

300-5000 nm

IQE Measurement System  

· 50 mm integrating sphere

Optional, available as an add-on

· Internal quantum efficiency

measurement determined from

material reflectance measurement

(hardware included) 250 - 2500nm range.

Measurement System

· Source meter

Optional

Optional

· Measurement time period for 100 IV

points is 17s

Included

· Voltage bias user settable

±10 V capability

Included

· Lock-in Amplifier

Included

· Chopper 4 - 200 Hz

Included

· Standard auto time constant feature

Included

· Temperature control (10-60 °C)  *

Accessory Available

· AC and DC measurement mode

Included

Sample Placement

· 50 × 50 mm  simple sample spacer

.for proper placement of the sample

under the monochromatic and bias

light beam. Includes simple

electrical connections.

A simple sample spacer is included, and various cell chucks are available as add-ons

Software

and Interface

· Modern software written in .NET

(Windows 11 Operating System)

Included

Included

· Compatible with Windows

10/11, 32/64bit

Included

Included

· Data files and automation

log exportable as ASCII

Included

Included

· Pre-configured and tested control

computer included

Included

Included

· Built in microcontroller switches

and monitors signals automatically

Included

Included

· 1 USB port

Included

Included

· 1 IEC 60320 C14 power entry inlet

Included

Included

Compliance

Intended for use in measurements

according to ASTM E 1021-15,

ASTM E948, IEC 60904-8, IEC 60904-1

Included

Included

Power system

· Single phase, configurable for 230 VAC,

50 Hz or 110 VAC, 60 Hz

Included

Included